首页> 外国专利> Measuring device and measuring method for in-process measurement on test specimens during a machining operation on a processing machine, in particular a grinding machine

Measuring device and measuring method for in-process measurement on test specimens during a machining operation on a processing machine, in particular a grinding machine

机译:在加工机器,特别是磨床的加工操作过程中对试样进行过程中测量的测量装置和测量方法

摘要

An inventive measuring device 2 for in-process measurement on test specimens during a machining operation on a processing machine, in particular a grinding machine 4, has a base body 18 and a measuring head 12 which is movable between a rest position and a measuring position and with the main body 18 via a linkage 14th The measuring head 12 in the measuring position follows orbital rotations of the test object about an axis of rotation, the measuring head 12 having a linear axis deflectable probe 36 for receiving measured values during a measuring operation and wherein a control device 80 for Control of the measuring process is provided. According to the invention, the control device 80 is designed and set up such that the measuring device 2 can be calibrated in a calibration mode.
机译:本发明的用于在处理机,特别是磨床4的机加工过程中对试样进行过程中测量的测量装置2具有基体18和测量头12,该测量头在静止位置和测量位置之间可移动。并通过连接件14与主体18连接。处于测量位置的测量头12跟随测试对象绕旋转轴线的轨道旋转,测量头12具有线性轴可偏转探头36,用于在测量操作期间接收测量值其中设有用于控制测量过程的控制装置80。根据本发明,控制装置80被设计和设置成使得测量装置2可以以校准模式被校准。

著录项

  • 公开/公告号DE102012018580B4

    专利类型

  • 公开/公告日2015-06-11

    原文格式PDF

  • 申请/专利权人 JENOPTIK INDUSTRIAL METROLOGY GERMANY GMBH;

    申请/专利号DE20121018580

  • 发明设计人 JÖRG SEEWIG;

    申请日2012-09-20

  • 分类号B23Q17/20;G01B5/20;B24B49/04;

  • 国家 DE

  • 入库时间 2022-08-21 14:55:51

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