首页> 外国专利> Method for correcting a measured value profile by eliminating periodically occurring measuring artifacts, in particular in the case of a soil compactor

Method for correcting a measured value profile by eliminating periodically occurring measuring artifacts, in particular in the case of a soil compactor

机译:通过消除周期性出现的测量伪影来校正测量值轮廓的方法,尤其是在土壤压实机的情况下

摘要

A method for correcting a measured value course by eliminating periodically occurring measurement artefacts, in particular in the case of a measured value profile representing the movement of a compactor roller of a soil compactor, comprises the measures: a) providing a measured value profile (M) representing a periodically repeating event, b) dividing the measured value profile ( M) period characteristic curves associated with a plurality of consecutive periods (P) of the periodically repeating event, c) based on the period measurement curves associated with the plurality of periods (P), determining a mean period measurement history, d) forming a Difference between the period measurements associated with the plurality of periods (P) and the average period history for providing difference period measurements associated with the periods (P), e) based on the difference period measurements determining a corrected measurement history for the plurality of consecutive periods (P) of the periodically repeating event.
机译:一种用于通过消除周期性出现的测量伪影来校正测量值过程的方法,特别是在代表土壤压实机的压实机辊的运动的测量值轮廓的情况下,包括以下措施:a)提供测量值轮廓(M )代表周期性重复事件,b)将与周期性重复事件的多个连续周期(P)相关的测量值轮廓(M)周期特征曲线进行划分,c)基于与多个周期相关的周期测量曲线(P),确定平均周期测量历史,d)形成与多个周期(P)相关的周期测量和用于提供与周期(P)相关的差异周期测量的平均周期历史之间的差,e)在差异周期测量中确定周围的多个连续周期(P)的校正测量历史偶发事件。

著录项

  • 公开/公告号DE102014205503A1

    专利类型

  • 公开/公告日2015-10-01

    原文格式PDF

  • 申请/专利权人 HAMM AG;

    申请/专利号DE201410205503

  • 申请日2014-03-25

  • 分类号G01D1/02;G01D3/02;G01D7;E01C19/28;

  • 国家 DE

  • 入库时间 2022-08-21 14:55:04

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