首页> 外国专利> A method of structuring line-type features using a multi-structuring process that enables the use of narrower contact inclusion spacing rules

A method of structuring line-type features using a multi-structuring process that enables the use of narrower contact inclusion spacing rules

机译:一种使用多重结构化过程来构造线型特征的方法,该方法可以使用更窄的接触包含间距规则

摘要

A method of identifying a structure for an overall target intersection mask used in structuring line-like features comprising a non-rectangular target aperture feature having an inner concave corner, dividing the entire target intercept mask structure into first and second target sub-structures, wherein the first target sub-structure is a first rectangular aperture feature according to a first region, but not the entire non-rectangular target opening feature, and the second target substructure comprises a second rectangular opening feature corresponding to a second area but not the entire non-rectangular target opening feature, the first and second openings adjacent to the inner concave Corner, and generating first and second sets of mask data according to the first and second target sub-structures, wherein the first and / or second sets of mask data are based on an identified distance rule generated by the contact to the end of the cutting line.
机译:一种用于识别用于构造线状特征的整体目标交叉口罩的结构的方法,该方法包括具有内部凹角的非矩形目标孔径特征,将整个目标拦截面罩结构分为第一和第二目标子结构,其中第一目标子结构是根据第一区域的第一矩形孔径特征,而不是整个非矩形目标开口特征,并且第二目标子结构包括与第二区域相对应的第二矩形开口特征,而不是整个非矩形目标特征-矩形目标开口特征,第一和第二开口与内凹角相邻,并根据第一和第二目标子结构生成第一和第二掩模数据集,其中第一和/或第二掩模数据集为基于确定的距离规则,该距离规则是由与切割线末端的接触产生的。

著录项

  • 公开/公告号DE102015200107A1

    专利类型

  • 公开/公告日2015-08-27

    原文格式PDF

  • 申请/专利权人 GLOBAL FOUNDRIES INC.;

    申请/专利号DE201510200107

  • 发明设计人 LEI YUAN;JONGWOOK KYE;HARRY J. LEVINSON;

    申请日2015-01-08

  • 分类号G03F1/70;

  • 国家 DE

  • 入库时间 2022-08-21 14:54:51

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