Measurement system for refractive index and birefringence changes caused by nonlinear effects in optical material microareas

摘要

The system is composed of the femtosecond laser (FS), the photonic optical fibre (SF), the optical system with the light-splitting element (DW) and two optical channels (KO1, K02) and the interferometric system, particularly in a form of the VAWI interferometer situated in the optical axis of the measurement beam emerging from the optical system. The first optical channel (KO1) includes the monochromator (MCR) with the condenser (K) forming the measurement beam and the monochromator (MCR) at the entrance is connected to the photonic optical fibre (SF). The mirror system of the second optical channel (KO2) includes the moveable mirror (ZP) which changes the optical path length of the second beam in the mentioned second optical channel (KO2). The tested material (M) is placed in the measurement area situated in the crossing of the measurement beam and the second beam delivered via the optical channel (KO2).