首页> 外国专利> DIFFERENTIAL PHASE-CONTRAST IMAGING WITH FOCUSING DEFLECTION STRUCTURE PLATES

DIFFERENTIAL PHASE-CONTRAST IMAGING WITH FOCUSING DEFLECTION STRUCTURE PLATES

机译:聚焦偏转结构板的差分相衬成像

摘要

PROBLEM TO BE SOLVED: To provide a deflection device for X-ray differential phase-contrast imaging.SOLUTION: A deflection device 28 for X-ray differential phase-contrast imaging comprises a deflection structure with a first plurality 44 of first areas 46, and a second plurality 48 of second areas 50. The first areas 46 are provided to change the phase and/or amplitude of an X-ray radiation and the second areas 50 are X-ray transparent. The first areas 46 and second areas 50 are arranged periodically such that, in the cross section, the deflection structure is provided with a profile arranged such that the second areas are provided in form of groove-like recesses 54 formed between the first areas 46 provided as projections 56. The adjacent projections 56 form respective side surfaces 58 partly enclosing the respective recess 54 arranged in between. The side surfaces of each recess 54 have a varying distance 60 across the depth 62 of the recess 54.SELECTED DRAWING: Figure 3
机译:解决的问题:提供一种用于X射线差分相衬成像的偏转装置。解决方案:一种用于X射线差分相衬成像的偏转装置28包括具有第一组多个第一区域46的偏转结构,以及第二区域48包括第二多个第二区域48。第一区域46被设置为改变X射线辐射的相位和/或振幅,并且第二区域50是X射线透明的。第一区域46和第二区域50周期性地布置,使得在横截面中,偏转结构设置有轮廓,使得第二区域以在第一区域46和第二区域46之间形成的槽状凹部54的形式提供。相邻的凸起56形成相应的侧面58,该侧面58部分地包围布置在它们之间的相应的凹部54。每个凹槽54的侧面在凹槽54的深度62上具有变化的距离60。

著录项

  • 公开/公告号JP2016127960A

    专利类型

  • 公开/公告日2016-07-14

    原文格式PDF

  • 申请/专利权人 KONINKLIJKE PHILIPS NV;

    申请/专利号JP20160023849

  • 发明设计人 EWALD ROESSL;THOMAS KOEHLER;

    申请日2016-02-10

  • 分类号A61B6;

  • 国家 JP

  • 入库时间 2022-08-21 14:47:26

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号