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DIFFERENTIAL PHASE-CONTRAST IMAGING WITH FOCUSING DEFLECTION STRUCTURE PLATES
DIFFERENTIAL PHASE-CONTRAST IMAGING WITH FOCUSING DEFLECTION STRUCTURE PLATES
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机译:聚焦偏转结构板的差分相衬成像
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摘要
PROBLEM TO BE SOLVED: To provide a deflection device for X-ray differential phase-contrast imaging.SOLUTION: A deflection device 28 for X-ray differential phase-contrast imaging comprises a deflection structure with a first plurality 44 of first areas 46, and a second plurality 48 of second areas 50. The first areas 46 are provided to change the phase and/or amplitude of an X-ray radiation and the second areas 50 are X-ray transparent. The first areas 46 and second areas 50 are arranged periodically such that, in the cross section, the deflection structure is provided with a profile arranged such that the second areas are provided in form of groove-like recesses 54 formed between the first areas 46 provided as projections 56. The adjacent projections 56 form respective side surfaces 58 partly enclosing the respective recess 54 arranged in between. The side surfaces of each recess 54 have a varying distance 60 across the depth 62 of the recess 54.SELECTED DRAWING: Figure 3
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