ABNORMALITY DETECTION PROCEDURE DEVELOPMENT DEVICE AND ABNORMALITY DETECTION PROCEDURE DEVELOPMENT METHOD

摘要

PROBLEM TO BE SOLVED: To assist development of an abnormality detection procedure with high detection capability, and to reduce a development man-hour.;SOLUTION: An abnormality detection development device 10 comprises: a parameter setting unit 14 that sets a parameter verification range about a parameter pertaining to an abnormality determination included in an abnormality detection procedure of a machine device; an evaluation unit 15 that varies a value of the parameter within the parameter verification range, and evaluates an abnormality detection performance of the abnormality detection procedure on the values of varied respective parameters; and a display unit 19 that displays a performance evaluation table serving as a list of the abnormality detection performance evaluated by the evaluation unit 15 on the values of respective parameters.;SELECTED DRAWING: Figure 2;COPYRIGHT: (C)2016,JPO&INPIT