首页> 外国专利> MEASURING METER SYSTEM, MEASUREMENT DATA PROCESSOR, MEASURING METER AND MEASUREMENT DATA PROCESSING METHOD

MEASURING METER SYSTEM, MEASUREMENT DATA PROCESSOR, MEASURING METER AND MEASUREMENT DATA PROCESSING METHOD

机译:测量仪表系统,测量数据处理器,测量仪表和测量数据处理方法

摘要

PROBLEM TO BE SOLVED: To provide a measuring meter system capable of reducing deficit in measurement data.;SOLUTION: The measuring meter system transmits a piece of measurement data which is measured by a measuring meter to a measurement data processor using an infrared ray communication. When the measurement data processor receives the measurement data from the measuring meter, an infrared ray light receiving section converts the measurement data into an electric signal, and determines the existence of influence by a disturbance light based on a potential comparison of electric signal between light-ON and turnoff. When determining the existence of influence by the disturbance light, an instruction is given to the measuring meter to raise the infrared ray emission strength via the infrared ray communication. The measuring meter emits the infrared ray with an increased strength.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2017,JPO&INPIT
机译:解决的问题:提供一种能够减少测量数据的不足的测量仪系统。解决方案:测量仪系统使用红外线通信将测量仪测量的一条测量数据传输到测量数据处理器。当测量数据处理器从测量仪接收到测量数据时,红外线接收部分将测量数据转换为电信号,并根据光之间电信号之间的电势比较来确定是否存在干扰光的影响。开启和关闭。当确定是否存在干扰光的影响时,通过红外线通信向测量仪发出指令以提高红外线的发射强度。测量仪会发出强度更高的红外线。;选图:图1;版权所有:(C)2017,JPO&INPIT

著录项

  • 公开/公告号JP2016177406A

    专利类型

  • 公开/公告日2016-10-06

    原文格式PDF

  • 申请/专利权人 NEC PLATFORMS LTD;

    申请/专利号JP20150055667

  • 发明设计人 NAGASHIMA KATSUSHIRO;

    申请日2015-03-19

  • 分类号G08C23/04;G08C25/00;H04Q9/00;H04B10/114;

  • 国家 JP

  • 入库时间 2022-08-21 14:44:33

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号