首页>
外国专利>
MEASURING METER SYSTEM, MEASUREMENT DATA PROCESSOR, MEASURING METER AND MEASUREMENT DATA PROCESSING METHOD
MEASURING METER SYSTEM, MEASUREMENT DATA PROCESSOR, MEASURING METER AND MEASUREMENT DATA PROCESSING METHOD
展开▼
机译:测量仪表系统,测量数据处理器,测量仪表和测量数据处理方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
PROBLEM TO BE SOLVED: To provide a measuring meter system capable of reducing deficit in measurement data.;SOLUTION: The measuring meter system transmits a piece of measurement data which is measured by a measuring meter to a measurement data processor using an infrared ray communication. When the measurement data processor receives the measurement data from the measuring meter, an infrared ray light receiving section converts the measurement data into an electric signal, and determines the existence of influence by a disturbance light based on a potential comparison of electric signal between light-ON and turnoff. When determining the existence of influence by the disturbance light, an instruction is given to the measuring meter to raise the infrared ray emission strength via the infrared ray communication. The measuring meter emits the infrared ray with an increased strength.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2017,JPO&INPIT
展开▼