METHOD FOR CORRECTING STRESS VALUE IN INFRARED STRESS MEASUREMENT SYSTEM, AND INFRARED STRESS MEASUREMENT SYSTEM USING THE SAME

摘要

PROBLEM TO BE SOLVED: To provide a correction method which, when finding the stress value of an object to be measured that is configured from a base substance and a coating film by processing an infrared photographic image, makes it possible to bring it closer to a more accurate stress value.;SOLUTION: The method of correcting a stress value in an infrared stress measurement system of the present invention identifies the variable of a theoretical solution to a coating film surface by curve-fitting, by a least square method, the theoretical solution to the temperature amplitude of the coating film surface obtained from a mono-dimensional heat conduction equation based on the heat conduction and thermoelastic effect of a base substance and a coating film to the frequency characteristic of temperature change component and phase component based on the thermoelastic effect obtained by different vibration frequencies, and corrects the effect of heat conduction by the coating film, making it possible to find an accurate stress value.;SELECTED DRAWING: Figure 6;COPYRIGHT: (C)2016,JPO&INPIT