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HIGH FREQUENCY CONDUCTIVITY MEASUREMENT DEVICE AND HIGH FREQUENCY CONDUCTIVITY MEASUREMENT METHOD

机译:高频电导率测量装置及高频电导率测量方法

摘要

PROBLEM TO BE SOLVED: To provide a high frequency conductivity measurement device and a high frequency conductivity measurement method which can easily measure the conductivity of a conductor plate to be measured at a high frequency.;SOLUTION: A high frequency conductivity measurement device 1 has a first resonator 2 that induces a first resonance mode, and a second resonator 3 that has a conductive plate to be measured 5 between the second resonator 3 and the first resonator 2, and induces a second resonance mode different from the first resonance mode. The first resonance mode and second resonance mode are measured at the same time.;COPYRIGHT: (C)2016,JPO&INPIT
机译:解决的问题:提供一种高频电导率测量装置和高频电导率测量方法,其可以容易地测量要在高频下测量的导体板的电导率。解决方案:高频电导率测量装置1具有第一谐振器2引起第一谐振模式,第二谐振器3具有在第二谐振器3和第一谐振器2之间要被测量的导电板5,并引起不同于第一谐振模式的第二谐振模式。同时测量第一共振模式和第二共振模式。版权所有:(C)2016,JPO&INPIT

著录项

  • 公开/公告号JP2015227850A

    专利类型

  • 公开/公告日2015-12-17

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP20140114360

  • 发明设计人 IWAI TOSHIKI;MIZUTANI DAISUKE;

    申请日2014-06-02

  • 分类号G01R27/02;G01N22/00;G01R27/26;

  • 国家 JP

  • 入库时间 2022-08-21 14:42:37

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