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Electron microscope with a goniometer, and the goniometer stage

机译:带有测角仪的电子显微镜和测角仪平台

摘要

PROBLEM TO BE SOLVED: To provide a gonio stage which alleviates the characteristic vibration of a specimen holder as much as possible.;SOLUTION: The gonio stage has vibration control means for alleviating the characteristic vibration of a specimen holder. In a suitable embodiment of the gonio stage, the vibration control means is configured by a collet mechanism. In the suitable embodiment of the gonio stage, the collet mechanism clamps the specimen holder at the axial centroid position of the specimen holder. Also, the electron microscope of the present application has the gonio stage.;COPYRIGHT: (C)2013,JPO&INPIT
机译:要解决的问题:提供一种可尽可能减轻样品架特征振动的测角台;解决方案:测样品台具有振动控制装置,可减轻样品架的特征振动。在戈尼奥台的合适实施例中,振动控制装置由筒夹机构构造。在戈尼奥台的合适的实施例中,夹头机构将样本夹夹持在样本夹的轴向重心位置。另外,本申请的电子显微镜具有gonio平台。;版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP5890626B2

    专利类型

  • 公开/公告日2016-03-22

    原文格式PDF

  • 申请/专利权人 株式会社メルビル;

    申请/专利号JP20110168901

  • 发明设计人 宮崎 裕也;

    申请日2011-08-02

  • 分类号H01J37/20;H01J37/09;

  • 国家 JP

  • 入库时间 2022-08-21 14:40:54

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