UPDATING RELIABILITY PREDICTIONS USING MANUFACTURING ASSESSMENT DATA

摘要

In an approach to predicting reliability of semiconductor devices, one or more computer processors retrieve a first reliability prediction associated with a first reliability model. The one or more computer processors retrieve manufacturing reliability assessment data for a first manufacturing vintage of semiconductor devices. The one or more computer processors retrieve failure mechanism identification data associated with the manufacturing reliability assessment data. The one or more computer processors determine, based, at least in part, on the manufacturing reliability assessment data and associated failure mechanism identification data, a second reliability prediction. The one or more computer processors determine whether the second reliability prediction matches the first reliability prediction. Responsive to determining the second reliability prediction does not match the first reliability prediction, the one or more computer processors update the first reliability model.