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Automated Test Equipment, Instruction Provider for Providing a Sequence of Instructions, Method of Providing Signal to a Device Under Test, Method for Providing a Sequence of Instructions and Test System
Automated Test Equipment, Instruction Provider for Providing a Sequence of Instructions, Method of Providing Signal to a Device Under Test, Method for Providing a Sequence of Instructions and Test System
An automated test equipment includes a test processor configured to provide a signal to a device under test on the basis of a sequence of instructions defining an evaluation of test vectors. The test processor is configured to map a test vector onto a set of signal states or signal transitions. Furthermore, the test processor is configured to variably select a number of signal states or signal transitions provided in the signal based on a current test vector in dependence on a current instruction.
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