首页> 外国专利> METHOD AND APPARATUS FOR MANAGING ESTIMATION AND CALIBRATION OF NON-IDEALITY OF A PHASE INTERPOLATOR (PI)-BASED CLOCK AND DATA RECOVERY (CDR) CIRCUIT

METHOD AND APPARATUS FOR MANAGING ESTIMATION AND CALIBRATION OF NON-IDEALITY OF A PHASE INTERPOLATOR (PI)-BASED CLOCK AND DATA RECOVERY (CDR) CIRCUIT

机译:基于相位插值器(PI)的时钟和数据恢复(CDR)电路的非理想性的估计和校准的方法和装置

摘要

A method for managing estimation and calibration of non-ideality of a Clock and Data Recovery (CDR) circuit. The method comprises A) selecting a first output path for calibration comprising at least a first Phase Interpolator (PI) of a plurality of PIs, at least one of a plurality of output-side programmable delay elements, an external delay element, at least one sampler, a first and a second external multiplexer, B) programming the output-side programmable delay element using a Digital Delay Control Code (DDCC), C) calibrating the external delay element until a given predetermined criterion based on an early-late detection method is met, D) upon satisfaction of the predetermined criterion, retaining a corresponding Digital External Delay Control Code (DEDCC) in the external delay element for subsequent use, E) selecting a second output path for calibration comprising at least a second PI of the plurality of PIs, the at least one of the plurality of output-side programmable delay elements, external delay element, at least one sampler, the first and second external multiplexers, F) calibrating the output-side programmable delay element until the given predetermined criterion based on the early-late detection method is met, G) upon satisfaction of the predetermined criterion, retaining the corresponding DDCC in the output-side programmable delay element for subsequent use, H) repeating the steps E-G for each of the remaining PIs such that the remaining output-side programmable delay elements are each separately calibrated, I) selecting a first input path for calibration comprising the at least first Phase Interpolator (PI) of the plurality of PIs, at least one of the plurality of input-side programmable delay elements, the external delay element, at least one sampler, the first and second external multiplexers, J) programming the input-side programmable delay element using the Digital Delay Control Code (DDCC), K) calibrating the external delay element until the given predetermined criterion based on the early-late detection method is met, L) upon satisfaction of the predetermined criterion, retaining a corresponding Digital External Delay Control Code (DEDCC) in the external delay element for subsequent use and M) assigning at least one value of a Binary Control Code (BCC) to select a unique phase in a given quadrant of a full phase cycle, N) calibrating the input-side programmable delay element until the given predetermined criterion based on the early-late detection method is met, O) upon satisfaction of the predetermined criterion, retaining the corresponding DDCBC in the input-side programmable delay element for subsequent use and P) repeating the steps M-O for each of the remaining unique phases in the inputs to the PI such that the remaining input-side programmable delay elements are each separately calibrated.
机译:一种用于管理时钟和数据恢复(CDR)电路的非理想性的估计和校准的方法。该方法包括:A)选择用于校准的第一输出路径,该第一输出路径包括多个PI中的至少一个第一相位内插器(PI),多个输出侧可编程延迟元件中的至少一个,外部延迟元件,至少一个。采样器,第一和第二外部多路复用器,B)使用数字延迟控制码(DDCC)对输出侧可编程延迟元件进行编程,C)基于早期检测方法,校准外部延迟元件,直到达到给定的预定标准D)在满足预定标准后,在外部延迟元件中保留相应的数字外部延迟控制代码(DEDCC)以供后续使用; E)选择用于校准的第二输出路径,包括至少多个第二PI PI,多个输出侧可编程延迟元件中的至少一个,外部延迟元件,至少一个采样器,第一和第二外部多路复用器,F)校准输出端可编程延迟元件,直到满足基于早期检测方法的给定预定标准为止; G)在满足预定标准后,将相应的DDCC保留在输出端可编程延迟元件中以备后用,H)对其余的每个PI重复步骤EG,以便分别对其余的输出侧可编程延迟元件分别进行校准,I)选择用于校准的第一输入路径,该路径包括多个PI中的至少第一相位内插器(PI),多个输入侧可编程延迟元件中的至少一个,外部延迟元件,至少一个采样器,第一和第二外部多路复用器,J)使用数字延迟控制码(DDCC)对输入侧可编程延迟元件进行编程,K)校准外部延迟元件,直到满足基于早期检测方法的给定预定标准为止; L)满足预定条件确定标准,在外部延迟元件中保留相应的数字外部延迟控制码(DEDCC)以供后续使用,以及M)分配二进制控制码(BCC)的至少一个值,以选择完整的给定象限中的唯一相位N)校准输入侧可编程延迟元件,直到满足基于早期检测方法的给定预定标准为止; O)满足预定准则后,将相应的DDCBC保留在输入侧可编程延迟元件中为了随后的使用,P)对PI的输入中的每个剩余的唯一相位重复步骤MO,使得其余的输入侧可编程延迟元件每个都被分别校准。

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