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TECHNIQUES TO EFFICIENTLY COMPUTE ERASURE CODES HAVING POSITIVE AND NEGATIVE COEFFICIENT EXPONENTS TO PERMIT DATA RECOVERY FROM MORE THAN TWO FAILED STORAGE UNITS
TECHNIQUES TO EFFICIENTLY COMPUTE ERASURE CODES HAVING POSITIVE AND NEGATIVE COEFFICIENT EXPONENTS TO PERMIT DATA RECOVERY FROM MORE THAN TWO FAILED STORAGE UNITS
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机译:有效地计算具有正负系数的擦除码以允许从两个以上失败的存储单元进行数据恢复的技术
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摘要
Erasure code syndrome computation based on Reed Solomon (RS) operations in a Galois field to permit reconstruction of data of more than 2 failed storage units. Syndrome computation may be performed with coefficient exponents that consist of −1, 0, and 1. A product xD of a syndrome is computed as a left-shift of data byte D, and selective compensation based on the most significant bit of D. A product x−1D of a syndrome is computed as a right-shift of data byte D, and selective compensation based on the most significant bit of D. Compensation may include bit-wise XORing shift results with a constant derived from an irreducible polynomial associated with the Galois field. A set of erasure code syndromes may be computed for each of multiple nested arrays of independent storage units. Data reconstruction includes solving coefficients of the syndromes as a Vandermonde matrix.
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