首页> 外国专利> TECHNIQUES TO EFFICIENTLY COMPUTE ERASURE CODES HAVING POSITIVE AND NEGATIVE COEFFICIENT EXPONENTS TO PERMIT DATA RECOVERY FROM MORE THAN TWO FAILED STORAGE UNITS

TECHNIQUES TO EFFICIENTLY COMPUTE ERASURE CODES HAVING POSITIVE AND NEGATIVE COEFFICIENT EXPONENTS TO PERMIT DATA RECOVERY FROM MORE THAN TWO FAILED STORAGE UNITS

机译:有效地计算具有正负系数的擦除码以允许从两个以上失败的存储单元进行数据恢复的技术

摘要

Erasure code syndrome computation based on Reed Solomon (RS) operations in a Galois field to permit reconstruction of data of more than 2 failed storage units. Syndrome computation may be performed with coefficient exponents that consist of −1, 0, and 1. A product xD of a syndrome is computed as a left-shift of data byte D, and selective compensation based on the most significant bit of D. A product x−1D of a syndrome is computed as a right-shift of data byte D, and selective compensation based on the most significant bit of D. Compensation may include bit-wise XORing shift results with a constant derived from an irreducible polynomial associated with the Galois field. A set of erasure code syndromes may be computed for each of multiple nested arrays of independent storage units. Data reconstruction includes solving coefficients of the syndromes as a Vandermonde matrix.
机译:基于Galois字段中的Reed Solomon(RS)操作的擦除码校验子计算,以允许重建2个以上故障存储单元的数据。可以使用由-1、0和1组成的系数指数执行综合症计算。综合症的乘积xD计算为数据字节D的左移,并基于D的最高有效位进行选择性补偿。将校正子的乘积x −1 D计算为数据字节D的右移,并基于D的最高有效位进行选择性补偿。补偿可能包括按位进行XORing移位的结果由与Galois场相关的不可约多项式得出的常数。可以针对独立存储单元的多个嵌套阵列中的每一个来计算一组擦除码校验子。数据重建包括以Vandermonde矩阵求解综合症的系数。

著录项

  • 公开/公告号US2015347231A1

    专利类型

  • 公开/公告日2015-12-03

    原文格式PDF

  • 申请/专利权人 VINODH GOPAL;ERDINC OZTURK;

    申请/专利号US201414293791

  • 发明设计人 VINODH GOPAL;ERDINC OZTURK;

    申请日2014-06-02

  • 分类号G06F11/10;H03M13/15;

  • 国家 US

  • 入库时间 2022-08-21 14:33:38

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