首页> 外国专利> Cross-point memory cells, non-volatile memory arrays, methods of reading a memory cell, methods of programming a memory cell, methods of writing to and reading from a memory cell, and computer systems

Cross-point memory cells, non-volatile memory arrays, methods of reading a memory cell, methods of programming a memory cell, methods of writing to and reading from a memory cell, and computer systems

机译:交叉点存储器单元,非易失性存储器阵列,存储器单元的读取方法,存储器单元的编程方法,存储器单元的写入和读取方法以及计算机系统

摘要

Cross-point memory cells, non-volatile memory arrays, methods of reading a memory cell, methods of programming a memory cell, and methods of writing to and reading from a memory cell are described. In one embodiment, a cross-point memory cell includes a word line extending in a first direction, a bit line extending in a second direction different from the first direction, the bit line and the word line crossing without physically contacting each other, and a capacitor formed between the word line and the bit line where such cross. The capacitor comprises a dielectric material configured to prevent DC current from flowing from the word line to the bit line and from the bit line to the word line.
机译:描述了交叉点存储单元,非易失性存储阵列,读取存储单元的方法,对存储单元进行编程的方法以及对存储单元进行写入和读取的方法。在一个实施例中,交叉点存储单元包括:在第一方向上延伸的字线,在与第一方向不同的第二方向上延伸的位线,该位线和该字线交叉而不彼此物理接触;在字线和位线之间交叉的地方形成电容器。电容器包括被配置为防止DC电流从字线流到位线以及从位线流到字线的电介质材料。

著录项

  • 公开/公告号US9419215B2

    专利类型

  • 公开/公告日2016-08-16

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US201414557306

  • 发明设计人 ROY E. MEADE;

    申请日2014-12-01

  • 分类号G11C11/24;H01L45;G11C13;G11C11/56;H01L27/10;H01L49/02;G11C11/34;

  • 国家 US

  • 入库时间 2022-08-21 14:32:00

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