Systems and Methods for Performing Tester-less Radio-Frequency Testing on Wireless Communications Circuitry

摘要

Radio-frequency performance of wireless communications circuitry on an electronic device under test (DUT) may be tested without external test equipment such as signal analyzers or signal generators. A first DUT may transmit test signals to a second DUT. External attenuator circuitry interposed between the DUTs may attenuate the test signals to desired power levels. The second DUT may characterize and/or calibrate receiver performance by generating wireless performance metric data based on the attenuated test signals. A single DUT may transmit test signals to itself via corresponding transmit and receive ports coupled together through the attenuator. The DUT may generate performance metric data based on the test signals. The DUT may include feedback receiver circuitry coupled to an output of a transmitter via a feedback, path and may characterize and/or calibrate transmit performance using test signals transmitted by the transmitter and received by the feedback receiver.