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Dual infrared band apparatus and method for thermally mapping a component in a high temperature combustion environment

机译:在高温燃烧环境中对部件进行热成像的双红外波段设备和方法

摘要

Apparatus and method for thermally mapping a component in a high temperature environment. An optical probe (10) has a field of view (14) arranged to encompass a surface of a component (15) to be mapped. The probe (10) captures infrared (IR) emissions in the near or mid IR band. An optical fiber (16) has a field of view to encompass a spot location (18) on the surface of the component within the field of view (14) of the probe (12). The fiber (16) captures emissions in the long IR band. The emissions in the long IR band are indicative of an emittance value at the spot location. This information may be used to calibrate a radiance map of the component generated from the emissions in the near or mid IR band and thus map the absolute temperature of the component regardless of whether the component includes a TBC.
机译:用于在高温环境中对组件进行热绘图的设备和方法。光学探头( 10 )的视场( 14 )设置为包围要映射的组件( 15 )的表面。探头( 10 )捕获近红外波段或中红外波段的红外(IR)辐射。光纤( 16 )的视场包含在视场内( 14 < / B>)( 12 )。光纤( 16 )捕获长红外波段的发射。较长的IR波段中的发射指示光斑位置处的发射值。该信息可用于校准由近红外波段或中红外波段的发射所产生的组件的辐射度图,从而无论组件是否包括TBC都可以绘制组件的绝对温度。

著录项

  • 公开/公告号US9400217B2

    专利类型

  • 公开/公告日2016-07-26

    原文格式PDF

  • 申请/专利权人 SIEMENS ENERGY INC.;

    申请/专利号US201414294530

  • 发明设计人 ERWAN BALEINE;CHRISTINE P. SPIEGELBERG;

    申请日2014-06-03

  • 分类号G01N21/85;G01J5/00;G01J5/10;G01J5/08;G02B6/42;G01J5/04;G01J5/60;G02B6/36;G02B6/10;

  • 国家 US

  • 入库时间 2022-08-21 14:30:51

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