首页> 外国专利> X-ray radiography system for differential phase contrast imaging of an object under investigation using phase-stepping

X-ray radiography system for differential phase contrast imaging of an object under investigation using phase-stepping

机译:使用相步进技术对正在研究的对象进行差分相衬成像的X射线射线照相系统

摘要

An X-ray radiography system for differential phase contrast imaging of an object under investigation by phase-stepping is provided. The X-ray radiography has an X-ray emitter for generating a beam path of quasi-coherent X-ray radiation, an X-ray image detector with pixels arranged in a matrix, and a diffraction or phase grating, in which the X-ray emitter has an X-ray tube with a cathode and an anode. The X-ray tube is constructed in such a way that an electron ray beam originating from the cathode is associated with focusing electronics which produce, from electrons which are incident on an anode, at least one linear-shaped electron fan beam.
机译:提供了一种用于通过相步进对被调查对象进行差分相衬成像的X射线照相系统。 X射线照相术具有用于产生准相干X射线辐射的光路的X射线发射器,像素排列成矩阵的X射线图像检测器以及衍射或相位光栅,其中X射线射线发射器具有一个带有阴极和阳极的X射线管。 X射线管被构造成使得源自阴极的电子束与聚焦电子器件相关联,聚焦电子器件从入射到阳极的电子产生至少一个线性电子扇形束。

著录项

  • 公开/公告号US9453803B2

    专利类型

  • 公开/公告日2016-09-27

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号US201313973156

  • 发明设计人 MARCUS RADICKE;

    申请日2013-08-22

  • 分类号A61B6;G01N23/04;H01J35/14;G21K1/06;

  • 国家 US

  • 入库时间 2022-08-21 14:30:44

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