Structures and methods for parallel testing of multiple read heads in two dimensional magnetic recording sliders

摘要

Structures and methods are disclosed for parallel biasing and testing, at dc and high frequency, of two or more read heads within a two dimensional magnetic recording (TDMR) slider. Testing of heads comprises both conventional tests of the individual heads within the slider, as well as tests for interactions between the heads which are very closely spaced within the slider and thus may exhibit various magnetic, capacitive, ohmic, and stress-related interactions not seen in non-TDMR heads having only a single read head. Overall testing times are nearly the same as for single head testing.