首页> 外国专利> Detection apparatus, exposure apparatus, device fabrication method and filter to reduce a difference between detected intensity values of lights having different wavelength ranges

Detection apparatus, exposure apparatus, device fabrication method and filter to reduce a difference between detected intensity values of lights having different wavelength ranges

机译:检测装置,曝光装置,装置制造方法和滤光器,以减小具有不同波长范围的光的检测强度值之间的差异

摘要

The present invention provides a detection apparatus which detects an object to be detected, the apparatus including an illumination system configured to illuminate the object with light containing a first wavelength range and a second wavelength range different from the first wavelength range, a detector configured to detect light from the object illuminated by the illumination system, and an optical member configured to set a transmittance for light in the first wavelength range and a transmittance for light in the second wavelength range to be different from each other, thereby reducing a difference between an intensity value of the light which has the first wavelength range and is detected by the detector and an intensity value of the light which has the second wavelength range and is detected by the detector.
机译:本发明提供一种检测装置,其检测要检测的物体,该装置包括照明系统,该照明系统被配置为用包含第一波长范围和不同于第一波长范围的第二波长范围的光照射该物体,检测器被配置为检测来自被照明系统照射的物体的光,以及光学构件,该光学构件被配置为将第一波长范围内的光的透射率和第二波长范围内的光的透射率设置为彼此不同,从而减小强度之间的差异。由检测器检测到的具有第一波长范围的光的强度值和由检测器检测到的具有第二波长范围的光的强度值。

著录项

  • 公开/公告号US9291921B2

    专利类型

  • 公开/公告日2016-03-22

    原文格式PDF

  • 申请/专利权人 HIRONORI MAEDA;

    申请/专利号US201213478363

  • 发明设计人 HIRONORI MAEDA;

    申请日2012-05-23

  • 分类号G03F9/00;

  • 国家 US

  • 入库时间 2022-08-21 14:30:24

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