首页> 外国专利> Method for calibrating a measuring device for inspecting surfaces on the basis of Barkhausen noises for a specified component geometry

Method for calibrating a measuring device for inspecting surfaces on the basis of Barkhausen noises for a specified component geometry

机译:校准用于根据给定的部件几何形状的巴克豪森噪声来检查表面的测量设备的方法

摘要

A method for enhancing inspection of components of specific geometry based on Barkhausen noises. The method includes specifying a first calibration curve that is independent of the component geometry, which describes the relationship between surface hardness values and measured Barkhausen noise signals. A first noise signal is determined by the measuring device for a reference component having the specified geometry and a first hardness value. A second noise signal is determined for a second reference component, having the specified geometry and a second hardness value lower than the first. A second calibration curve is determined, in which the first calibration curve is fitted to the first noise signal at the first hardness value and to the second noise signal at the second hardness value, such that using the second calibration curve, the measured noise signal of a component having the specified geometry relates with a surface hardness value.
机译:一种基于巴克豪森噪声的用于增强对特定几何形状的组件的检查的方法。该方法包括指定独立于部件几何形状的第一校准曲线,该第一校准曲线描述了表面硬度值与测得的巴克豪森噪声信号之间的关系。测量装置针对具有规定的几何形状和第一硬度值的参考成分确定第一噪声信号。为第二参考分量确定第二噪声信号,该第二参考分量具有指定的几何形状并且第二硬度值低于第一参考值。确定第二校准曲线,其中将第一校准曲线拟合到第一硬度值的第一噪声信号和第二硬度值的第二噪声信号,从而使用第二校准曲线,测得的噪声信号为具有指定几何形状的组件与表面硬度值相关。

著录项

  • 公开/公告号US9404989B2

    专利类型

  • 公开/公告日2016-08-02

    原文格式PDF

  • 申请/专利权人 ZF FRIEDRICHSHAFEN AG;

    申请/专利号US201314385799

  • 发明设计人 OLIVER BLEICHER;YIWEN XU;HERMAN YAKARIA;

    申请日2013-03-04

  • 分类号G01R35/00;G01N27/72;G01N27/80;

  • 国家 US

  • 入库时间 2022-08-21 14:29:58

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