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Method and apparatus for calibrating comparator offset of successive-approximation-register analog-to-digital converter

机译:校准逐次逼近寄存器模数转换器的比较器偏移的方法和装置

摘要

A circuit and method compensates for comparator offset in a successive approximation register analog-to-digital converter. The circuit includes a multiplexed sampler to sample either a common mode voltage or an input signal. The sampled signal is added to a conversion voltage and an offset correction voltage and input to a comparator. The comparator determines a polarity of deviation of the sum of the sampled signal, conversion voltage and off-set correction voltage. Based on the polarity, the offset correction voltage and the conversion voltage are alternately subjected to a successive approximation process to compensate for the offset of the sum from the sampled input signal or sampled common voltage signal.
机译:一种电路和方法补偿逐次逼近寄存器模数转换器中的比较器偏移。该电路包括一个多路复用采样器,用于采样共模电压或输入信号。采样的信号被添加到转换电压和偏移校正电压,并且被输入到比较器。比较器确定采样信号,转换电压和偏移校正电压之和的偏差的极性。基于极性,将偏移校正电压和转换电压交替地进行逐次逼近处理,以补偿总和从采样的输入信号或采样的公共电压信号的偏移。

著录项

  • 公开/公告号US9413374B2

    专利类型

  • 公开/公告日2016-08-09

    原文格式PDF

  • 申请/专利权人 REALTEK SEMICONDUCTOR CORP.;

    申请/专利号US201414508375

  • 发明设计人 CHIA-LIANG LEON LIN;

    申请日2014-10-07

  • 分类号H03M1/06;H03M1/12;H03M1/46;

  • 国家 US

  • 入库时间 2022-08-21 14:28:30

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