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Method of and an apparatus conducting calibration for phased-array shear wave channels inspecting square bars

机译:进行相控阵剪切波通道检查方筋的校准的方法和装置

摘要

Disclosed is a system and method suitable for calibrating a phased array system configured to inspect square bars. A square bar is provided with an array of parallel linear notches across the full range of the testing surface of the square bar for this calibrating purpose. The square bar is passed through the probe in probe's passive direction during the calibration. The phased array system is adjusted and calibrated so that the echo amplitude for each inspection channel of the phased array probe received from each notch is substantially equal. Then a known flaw with a typically expected flaw's size and shape is created on the same testing surface so that the system's sensitivity is adjusted using the amplitude of the echo signal from the known flaw as a baseline.
机译:公开了一种适于校准配置为检查方棒的相控阵系统的系统和方法。为了进行校准,在方棒的整个测试表面范围内为方棒提供了一系列平行的线性凹口。在校准过程中,方棒沿探头的被动方向穿过探头。调整并校准相控阵系统,以使从每个槽口接收的相控阵探头的每个检查通道的回波幅度基本相等。然后,在同一测试表面上会生成具有通常预期缺陷大小和形状的已知缺陷,以便使用来自已知缺陷的回波信号的幅度作为基线来调整系统的灵敏度。

著录项

  • 公开/公告号US9279786B2

    专利类型

  • 公开/公告日2016-03-08

    原文格式PDF

  • 申请/专利权人 JINCHI ZHANG;

    申请/专利号US201213591893

  • 发明设计人 JINCHI ZHANG;

    申请日2012-08-22

  • 分类号G01N29/00;G01N29/26;G01N29/04;G01N29/27;

  • 国家 US

  • 入库时间 2022-08-21 14:27:59

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