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Fail address detector, semiconductor memory device including the same and method of detecting fail address
Fail address detector, semiconductor memory device including the same and method of detecting fail address
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机译:故障地址检测器,包括该故障地址检测器的半导体存储装置以及检测故障地址的方法
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摘要
A fail address detector includes cam latch groups configured to store fail addresses and a comparing section connected to the cam latch groups in common and configured to detect whether or not a fail address corresponding to a comparison address exists among the fail addresses received from the cam latch groups. The cam latch groups share the comparing section in time division.
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