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light unit with an extended light-emitting surface, and method for projecting a light unit with an extended light-emitting surface
light unit with an extended light-emitting surface, and method for projecting a light unit with an extended light-emitting surface
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机译:具有扩展的发光表面的照明单元以及投射具有扩展的发光表面的照明单元的方法
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摘要
Light unit with an extended light-emitting surface, and method for projecting a light unit with an extended light-emitting surface. A light unit (2) with an extended light-emitting surface includes a light source. (4), and a flat light distribution body (6) having a first main surface (8) and a second main surface (10) arranged on opposite sides of the flat light distribution body (6), wherein the source The light beam (4) is positioned outside the flat light distribution body (6), with light emitted by the light source (4) being coupled to the flat light distribution body (6) and being propagated in the light distribution body plane (6) through total internal reflection on the first and second main surfaces (8, 10), wherein the first main surface (8) has a plurality of surface irregularities (16), wherein light reaching an irregularity of surface (16) at an angle of incidence is reflected at a reflection angle that is different from the incidence angle with respect to the first main surface (8), with the reflection angle allowing light to be coupled outside the flat light distribution body (6), and where a total unevenness ratio the first major surface (8) is defined as a combined area of the plurality of surface irregularities (16) on the first major surface (8) divided by a total area of the first major surface (8) and where a Regional irregularity ratio is defined as a combined area of a subset of the plurality of surface irregularities in a subregion of the first major surface divided by a total area of the subregion of the first major surface, where the first major surface has at least least one square subregion (40) whose area is 10% of the total area of the first major surface (8) and whose irregularity ratio is is at least 50% higher than the total irregularity ratio.
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