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Method of improving the conductive properties and optical thin films of indium tin oxide (ITO) deposited

机译:改善铟锡氧化物(ITO)的导电性能和光学薄膜沉积的方法

摘要

Certain example embodiments of this invention relate to a method of activating an indium tin oxide (ITO) thin film deposited, directly or indirectly, on a substrate. The ITO thin film is baked in a low oxygen environment at a temperature of at least 450 degrees C. for at least 10 minutes so as to provide for (1) a post-baked resistivity of the ITO thin film that is below a resistivity of a corresponding air-baked ITO thin film, (2) a post-baked visible spectrum absorption and transmission of the ITO thin film that respectively are below and above the absorption and transmission of the corresponding air-baked ITO thin film, and (3) a post-baked infrared reflectivity of the ITO thin film that is above the reflectivity of the corresponding air-baked ITO thin film. The substrate with the activated ITO thin film may be used in a photovoltaic device, for example.
机译:本发明的某些示例实施例涉及一种活化直接或间接沉积在基板上的铟锡氧化物(ITO)薄膜的方法。在低氧环境中在至少450摄氏度的温度下烘烤ITO薄膜至少10分钟,以提供(1)ITO薄膜的后烘烤电阻率低于电阻率相应的空气烘焙的ITO薄膜;(2)分别在相应的空气烘焙的ITO薄膜的吸收和透射之下和之上的ITO薄膜的烘焙后可见光谱吸收和透射;以及(3) ITO薄膜的后烘焙红外反射率高于相应的空气烘焙ITO薄膜的反射率。具有激活的ITO薄膜的基板例如可以用于光伏器件中。

著录项

  • 公开/公告号BRPI1012040A2

    专利类型

  • 公开/公告日2016-05-17

    原文格式PDF

  • 申请/专利权人 GUARDIAN INDUSTRIES CORP.;

    申请/专利号BR2010PI12040

  • 发明设计人 DAVID M. BROADWAY;YIWEI LU;

    申请日2010-05-13

  • 分类号H01L31/0224;H01L31/18;

  • 国家 BR

  • 入库时间 2022-08-21 14:26:41

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