'A NON-DESTRUCTIVE METHOD FOR MEASUREMENT OF QUANTUM EFFICIENCY (QE) OF TANDEM JUNCTION THIN-FILM PHOTO VOLTAIC (PV) MODULES'

摘要

1. A non-destructive method for measurement of quantum efficiency (QE) of thin- film tandem junction photo V oltaic (PV) module, comprising the steps of: - covering the PV module under test with an opaque cover having an aperture and positioning the module so that QTH / monochromatic light spot from monochromator (2) falls at the desired point on the amorphous silicon (a-Si) tandem junction module surface; - focussing the light from said monochromator on the test module with the help of a chopper (4), lens system (3) and a bias light source (5); - saturating the bottom junction and the top junction of said tandem junction PV module with the help of a filter assembly (10). - amplifying the feeble response of light generated current by the test module and a calibrated reference detector at a reference frequency preset by the optical chopper (4), with the help of a preamplifier and recording it in a locking amplifier (LIA); - reading the output of said LIA with the help of a PC based data acquisition card (DAQ); and - determining the QE of the test module using the wavelength dependent responses of test module and detector measured by LIA along with detector responsivity data.