首页> 外国专利> WEIR FOR IMPROVED CRYSTAL GROWTH IN A CONTINUOUS CZOCHRALSKI PROCESS

WEIR FOR IMPROVED CRYSTAL GROWTH IN A CONTINUOUS CZOCHRALSKI PROCESS

机译:在连续的直拉工艺中改善晶体生长的Weir

摘要

An apparatus for growing ingots by the Czochralski method includes a growth chamber defining an enclosure configured to circulate a purge gas about the growing ingot and a crucible provided in the growth chamber configured to hold the molten silicon. A weir is supported in the crucible and is configured to separate the molten silicon into an inner growth region surrounding the melt/crystal interface from an outer region configured to receive the crystalline feedstock. The weir comprises at least one sidewall extending vertically and a cap extending substantially perpendicularly to the sidewall.
机译:通过切克劳斯基(Czochralski)方法生长晶锭的设备包括:生长室,该生长室限定了配置成使吹扫气体在生长晶锭周围循环的外壳;以及坩埚,其设置在生长室中以保持熔融硅。堰被支撑在坩埚中,并被配置为将熔融硅与被配置为接收晶体原料的外部区域分隔成围绕熔体/晶体界面的内部生长区域。堰包括至少一个垂直延伸的侧壁和基本上垂直于侧壁延伸的盖。

著录项

  • 公开/公告号IN2015KN01658A

    专利类型

  • 公开/公告日2016-01-22

    原文格式PDF

  • 申请/专利权人

    申请/专利号IN1658/KOLNP/2015

  • 发明设计人 SWAMINATHAN TIRUMANI N;

    申请日2015-06-01

  • 分类号C30B29/06;C30B15/12;

  • 国家 IN

  • 入库时间 2022-08-21 14:24:54

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