AUTOMATIC NUMERICAL TEST SYSTEM FOR MULTIPLE DISCRETE INTEGRATORS

摘要

The invention relates to an automatic numerical test system for multiple discrete integrators. According to the invention, the system has a direct path consisting of a comparator (1) centered in time as the difference between the next step and the previous step, a time delay element (2) equal with the time constant of a multiple discrete integrator (3) whose factor k is variable depending on the number of integration operations, a reverse path consisting of a delay element (4) and a proportionable element (5) which is parametrizable with the same factor k required for the signal return to the input level.