首页> 外国专利> Calibration method spectrographs image processing

Calibration method spectrographs image processing

机译:校准方法光谱仪图像处理

摘要

A method for calibrating an optical spectrograph image processing that has physical properties and a detector array positioned on a focal plane of the spectrograph image processing and having a horizontal plane and a predetermined pixel in the horizontal plane number located in pixel coordinates (n), comprising the steps of: detecting a spectrum of a known source; refer to a table of wavelengths known emission lines and relative intensities known, or Raman vibration frequencies and relative intensities known, or known intensity spectrum from the NIST calibrated intensity standard; and deriving an optical spectrograph model image processing, said parameters model spectrograph model based on the physical properties of the optical spectrograph image processing, for approximating the spectrum detected; characterized in that said pattern of optical spectrograph image processing follows using a technique of setting function that operates in a space intensity where the number of observables is always equal to the number of pixels in the horizontal plane and being greater the number of pixels the number of parameters of model variables; wherein said calibration method of an optical spectrograph image processing comprising the further steps of: forming an intensity function including said model parameters spectrograph, whereby said intensity function describes the spectrum to be measured by the optical spectrograph image processing as detects the array detector and refining said model parameters spectrograph with a residual function to minimize residual difference between spectral intensities detected and spectral intensities calculated based on said intensity function, representing a correlation wavelength to pixel location.
机译:一种用于校准具有物理性质的光学光谱仪图像处理的方法和一种位于光谱仪图像处理的焦平面上并且具有水平面和水平平面中的预定像素位于像素坐标(n)中的检测器阵列的方法,包括步骤:检测已知源的光谱;请参阅NIST校准强度标准中已知发射线和已知相对强度的波长表或已知拉曼振动频率和已知相对强度的表或已知强度谱;并基于光学光谱仪图像处理的物理特性推导所述光学光谱仪模型图像处理,所述参数模型光谱仪模型用于近似检测光谱。其特征在于,所述光学光谱仪图像处理模式采用设置功能技术,该功能在空间强度下操作,其中可观察物的数量始终等于水平面中的像素数量,并且像素数量大于像素数量。模型变量的参数;其中,所述光谱仪图像处理的校准方法进一步包括以下步骤:形成包括所述模型参数光谱仪的强度函数,其中,所述强度函数描述当检测阵列检测器并精制所述光谱仪图像处理时要测量的光谱具有残差函数的模型参数光谱仪,以最小化检测到的光谱强度与基于所述强度函数计算的光谱强度之间的残差,代表了与像素位置的相关波长。

著录项

  • 公开/公告号ES2569231T3

    专利类型

  • 公开/公告日2016-05-09

    原文格式PDF

  • 申请/专利权人 ROPER SCIENTIFIC INC.;

    申请/专利号ES20090012524T

  • 发明设计人 MCCLURE JASON;

    申请日2009-10-02

  • 分类号G01J3/28;

  • 国家 ES

  • 入库时间 2022-08-21 14:22:14

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号