首页> 外国专利> MACRO-MICRO COMPOSITE GRATING SCALE MEASUREMENT SYSTEM BASED ON VERTICAL AND HORIZONTAL CONVERSION AMPLIFICATION

MACRO-MICRO COMPOSITE GRATING SCALE MEASUREMENT SYSTEM BASED ON VERTICAL AND HORIZONTAL CONVERSION AMPLIFICATION

机译:基于垂直和水平转换放大的微-微复合栅尺测量系统

摘要

A macro-micro composite grating scale measurement system based on vertical and horizontal conversion amplification. The measurement system comprises a grating scale (1), a macro-micro reading system (2) which can conduct a relative movement relative to the grating scale (1), and a counting and image processing module, wherein the macro-micro reading system (2) directly faces a grating stripe basal plane and is disposed in parallel to the grating scale (1). The measurement system also comprises a measurement reference straight line (204a), wherein the measurement reference straight line (204a) and a grating stripe (101) acquired by an image sensor (202) are superposed in the counting and image processing module to form a superimposed image, and the measurement reference straight line (204a) and the grating stripe (101) form a certain included angle θ. By means of the structure, the measurement system can be compatible with the existing grating scales of an incremental type, an absolute type, etc., thereby having a strong applicability. The measurement system conducts macroscale displacement measurements using a high-speed low-accuracy grating scale, and acquires a reliable high-accuracy microscale displacement value using an efficient microscale reading module based on the mechanical-optical subdivision technology at the same time, thereby being suitable for grating scales having a large grating pitch size and having relatively low costs.
机译:基于垂直和水平转换放大的宏微复合光栅尺测量系统。该测量系统包括光栅尺(1),可相对于光栅尺(1)进行相对运动的宏微读取系统(2)以及计数和图像处理模块,其中,宏微读取系统(2)直接面对光栅条纹的基面,并平行于光栅尺(1)设置。该测量系统还包括测量参考直线(204a),其中,由图像传感器(202)获取的测量参考直线(204a)和光栅条纹(101)叠加在计数和图像处理模块中以形成基准图像(204a)和光栅条纹(101)形成一定的夹角θ。通过该结构,测量系统可以与增量型,绝对型等现有光栅尺兼容,从而具有很强的适用性。该测量系统使用高速低精度光栅尺进行宏尺位移测量,并使用基于机械光学细分技术的高效微尺读取模块同时获取可靠的高精度微尺位移值,因此非常适合用于具有大的栅距尺寸并且具有相对低的成本的光栅尺。

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