HEMISPHERE THICKNESS MEASUREMENT APPARATUS AND HEMISPHERE THICKNESS MEASUREMENT METHOD INSIDE CHAMBER USING MAGNETOSTRICTIVE ULTRASONIC WAVE

摘要

The present invention relates to a hemisphere thickness measurement apparatus, and a hemisphere thickness measurement method. The hemisphere thickness measurement apparatus measures the thickness of a hemisphere inside a chamber in real-time when a base material of the hemisphere exposed to a high-temperature condition is gradually eroded. More specifically, the hemisphere thickness measurement apparatus inside a chamber using a magnetostrictive ultrasonic wave can precisely measure a thickness change of the hemisphere in real-time by securing reliability of an ultrasonic wave in the high-temperature condition by using the magnetostrictive ultrasonic wave.;COPYRIGHT KIPO 2016