EYE DIAGRAM PREDICTION DEVICE, EYE DIAGRAM PREDICTION METHOD, AND TEST EQUIPMENT USING THE SAME

摘要

Provided are a device and a method for predicting an eye diagram to accurately measure the performance of a semiconductor device, and a test device using the same. The eye diagram predicting device comprises: a consecutive-two-waveform extraction unit for extracting consecutive two waveforms from an inputted signal; a parameter value detection unit for detecting parameter values of a plurality of parameters from the consecutive two waveforms outputted from the consecutive two waveforms extraction unit; and an eye diagram generation unit for predicting an eye diagram by using the parameter values detected in the parameter detection unit.