首页> 外国专利> APPARATUS FOR INSPECTING THE QUALITY OF MAGNETIZATION ON A MAGNET SPECIMEN AND METHOD FOR INSPECTING THE QUALITY OF MAGNETIZATION ON A MAGNET SPECIMEN WITH THE SAME

APPARATUS FOR INSPECTING THE QUALITY OF MAGNETIZATION ON A MAGNET SPECIMEN AND METHOD FOR INSPECTING THE QUALITY OF MAGNETIZATION ON A MAGNET SPECIMEN WITH THE SAME

机译:用于检查磁体标本上的磁化质量的设备和用于检查具有相同特征的磁体标本上的磁化质量的方法

摘要

magnet magnetized quality inspection apparatus of the present invention, an apparatus for detecting the magnetic quality of the magnet, a stage base (2) secured to the magnetic detection target magnet and Flexible stage plate 4 stage unit having (2,4), a sensing probe (3,5,6,7,50) containing the magnetic field sensor 50 for detecting the magnetic field of the magnet detection target is disposed on the stage plate 4 , a magnet magnetized quality detection device and a magnet magnetized quality detection to a controller 20 for determining the magnetic state of the detection target magnet by comparing the magnetic field sensor magnetic field output reference value that is stored in the storage unit and the magnetic field signal detected from the 50 It provides a method. ;
机译:本发明的磁铁的磁化质量检查装置,检测磁铁的磁质的装置,固定在该磁检测对象磁铁上的载物台基座(2)和具有(2,4)的挠性载物台板4载物台单元,在载物台板4上设置有探头(3、5、6、7、50),该探头(3、5、6、7、50)包括用于检测磁体检测对象的磁场的磁场传感器50,磁化质量检测装置以及磁化质量检测装置。控制器20用于通过比较存储在存储单元中的磁场传感器磁场输出参考值和从传感器50检测到的磁场信号来确定检测目标磁体的磁状态。 ;

著录项

  • 公开/公告号KR101619608B1

    专利类型

  • 公开/公告日2016-05-11

    原文格式PDF

  • 申请/专利权人 대성전기공업 주식회사;

    申请/专利号KR20140114375

  • 发明设计人 이원용;정태홍;나병철;

    申请日2014-08-29

  • 分类号G01L25;B62D15/02;B62D6/10;G01L3/10;G01L5/22;G01N27/72;

  • 国家 KR

  • 入库时间 2022-08-21 14:12:35

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