首页> 外国专利> Method for detecting target material by spectral mixture analysis of hyperspectral image

Method for detecting target material by spectral mixture analysis of hyperspectral image

机译:高光谱图像光谱混合分析检测目标物质的方法

摘要

the invention in a particular region for hyperspectral imaging (hyperspectral image) from the target to the distribution of the target material to the detection method for detecting a target substance according to the present invention, according to a specific area for the in the target material detection method using the second spectral image for detecting the distribution of the target material to the target from the second spectral image, by determining whether the target material in units of pixels, or O with the target material to the materials other than the target material detection, targets for the size to solve the problems of the were many prior art target material detection method in the case that is not detected when small, obtaining the second spectral image for the area to be analyzed, and the image-end member from the acquired second spectral image (image endmember) automatically extracted, here again performed the target spectrum (spectral purity screen by adding the target spectrum) as another end member (spectral unmixing) for the target material, and occupied for the target substance on the basis of the result by being configured obtain a rate to create a distribution diagram for the target material, o a detection sub-pixel (sub-pixel) based on the second spectral mixing analysis of the spectral image formed so that pixels can be substantially to target the target material only correctly detected without being there is provided a method using a target material detection. ;
机译:根据目标材料检测中的特定区域,在从目标到目标材料的分布到根据本发明的用于检测目标物质的检测方法的用于高光谱成像(高光谱图像)的特定区域中的本发明使用第二光谱图像从第二光谱图像检测目标材料向目标的分布的方法,通过确定目标材料是以像素为单位还是以O为目标材料来检测目标材料以外的材料,用于解决尺寸问题的尺寸目标是许多现有技术中的目标材料检测方法,该方法在很小的情况下没有被检测到,获得了待分析区域的第二光谱图像,以及从所获取的第二个图像末端成员自动提取光谱图像(图像末端成员),此处再次执行目标光谱(通过添加ta rget光谱)作为目标材料的另一个末端成员(光谱解混),并通过配置结果基于结果被目标物质占用,获得比率以创建目标材料的分布图,即检测子像素(提供一种使用目标材料检测的方法,该方法基于对形成的光谱图像的第二次光谱混合分析,从而使得像素可以基本上仅以正确地检测到的目标材料为目标,而无需正确检测。 ;

著录项

  • 公开/公告号KR101634792B1

    专利类型

  • 公开/公告日2016-06-29

    原文格式PDF

  • 申请/专利权人 한국지질자원연구원;

    申请/专利号KR20140146233

  • 发明设计人 김광은;

    申请日2014-10-27

  • 分类号G01N21/25;G01J3/28;G01J3/40;G01V8/00;G06T1/00;

  • 国家 KR

  • 入库时间 2022-08-21 14:12:19

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号