首页> 外国专利> MEASUREMENT OF LINEAR AND CIRCULAR DIATTENUATION IN OPTICAL ELEMENTS

MEASUREMENT OF LINEAR AND CIRCULAR DIATTENUATION IN OPTICAL ELEMENTS

机译:光学元件中线性和圆形衰减的测量

摘要

A system for measuring linear or circular diattenuation in an optical element includes a sample rotation stage for securing an optical element sample; a light source module for generating a source light beam and a detector module. The light source module and detector module are arranged with the sample rotation stage between them, thereby permitting the source light beam to propagate through a sample that may be secured in the sample stage and to the detector module. Linear motion control of the light source module and the detector module, as well as tilt control of the light source module, the sample rotation stage and the detector module is provided, thereby to facilitate detection, by the detector module of the modulated light intensity information corresponding to a diattenuation characteristic of the optical sample secured in the sample stage.
机译:一种用于测量光学元件中线性或圆形衰减的系统,包括用于固定光学元件样品的样品旋转台;以及用于固定光学元件样品的样品旋转台。用于产生源光束的光源模块和检测器模块。光源模块和检测器模块被布置成在它们之间具有样品旋转台,从而允许光源光束传播通过可以固定在样品台中的样品并到达检测器模块。提供光源模块和检测器模块的线性运动控制,以及光源模块,样品旋转台和检测器模块的倾斜控制,从而便于检测器模块检测调制光强度信息。对应于固定在样品台中的光学样品的衰减特性。

著录项

  • 公开/公告号EP2013594B1

    专利类型

  • 公开/公告日2016-11-16

    原文格式PDF

  • 申请/专利权人 HINDS INSTRUMENTS INC.;

    申请/专利号EP20070783044

  • 发明设计人 WANG BAOLIANG;

    申请日2007-05-01

  • 分类号G01N21/19;G01M11/02;

  • 国家 EP

  • 入库时间 2022-08-21 14:05:44

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号