SPATIAL PHASE-SHIFT SHEAROGRAPHY SYSTEM FOR STRAIN MEASUREMENT

摘要

Embodiments of a shearography system may include light sources configured to produce beams of light to illuminate a test area. Each of the beams of light may include a different wavelength. A camera may be configured to obtain intensity information corresponding to reflections of the lights off of the test area. An optical shearing device may be disposed in an optical path between the light sources and the camera and the optical shearing device may be configured to provide a shearing angle.