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RESIDUAL STRESS MEASUREMENT INSTRUMENT AND RESIDUAL STRESS MEASUREMENT METHOD

机译:残余应力测量仪及残余应力测量方法

摘要

PROBLEM TO BE SOLVED: To provide a residual stress measurement instrument and a residual stress measurement method which can reduce the measurement time of residual stress.SOLUTION: The instrument comprises: an X-ray generation source which irradiates a measurement object with X rays; a first detection element which detects an intensity of diffracted X rays of the measurement object in a first detection position; a second detection element which detects an intensity of diffracted X rays of the measurement object in a second detection position different from the first detection position; a moving mechanism which moves the first detection element and the second detection element along a line extending in a direction orthogonal to an incidence direction of the X rays; a movement control unit which drives the moving mechanism to control respective detection positions of the first detection element and the second detection element; and a stress calculation unit which calculates residual stress of the measurement object on the basis of intensity peaks of diffracted X rays respectively detected by moving the first detection element and the second detection element by the moving mechanism.SELECTED DRAWING: Figure 2
机译:解决的问题:提供一种残余应力测量仪器和一种残余应力测量方法,可以减少残余应力的测量时间。解决方案:该仪器包括:X射线发生源,该X射线发生源用X射线照射测量对象;第一检测元件,其在第一检测位置检测被测物的衍射X射线的强度。第二检测元件,其在与第一检测位置不同的第二检测位置中检测被测定物的衍射X射线的强度。移动机构,其使第一检测元件和第二检测元件沿着与X射线的入射方向正交的方向延伸的线移动。移动控制单元,其驱动移动机构以控制第一检测元件和第二检测元件的各自的检测位置;应力计算单元根据通过移动机构使第一检测元件和第二检测元件移动而分别检测出的衍射X射线的强度峰值来计算测量对象的残余应力。

著录项

  • 公开/公告号JP2017009356A

    专利类型

  • 公开/公告日2017-01-12

    原文格式PDF

  • 申请/专利权人 SINTOKOGIO LTD;

    申请/专利号JP20150123248

  • 发明设计人 KOBAYASHI YUJI;MATSUI AKINORI;

    申请日2015-06-18

  • 分类号G01N23/203;

  • 国家 JP

  • 入库时间 2022-08-21 14:01:58

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