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MINUTE CRACKING FORMING METHOD AND MINUTE CRACKING FORMING DEVICE OF SEMICONDUCTOR SUBSTRATE

机译:半导体基板的微小裂纹形成方法及微小裂纹形成装置

摘要

PROBLEM TO BE SOLVED: To provide a minute cracking forming method of a semiconductor substrate capable of efficiently obtaining chips of stable quality and a minute cracking forming device.;SOLUTION: The minute cracking forming method of a semiconductor substrate for forming, on a wafer inside which a modified area is formed by a laser beam, a minute cracking which becomes an originating point of cutting the wafer includes a grinding step for developing the minute cracking extending from the modified area by grinding the rear surface of the wafer in a state where a surface of the wafer is vacuum chucked to a table.;SELECTED DRAWING: Figure 15;COPYRIGHT: (C)2017,JPO&INPIT
机译:解决的问题:提供一种能够有效地获得质量稳定的芯片的半导体基板的微细裂纹形成方法和微细裂纹形成装置。解决方法:在晶片内部的用于形成的半导体基板的微细裂纹形成方法。通过激光束形成改质区域的微细裂纹成为切割晶片的起点,该微细裂纹包括磨削步骤,该微细裂纹用于在如下状态下通过对晶片的背面进行磨削来产生从改质区域延伸的微细裂纹。晶圆表面被真空吸盘固定在工作台上;选定的图纸:图15;版权:(C)2017,JPO&INPIT

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