首页> 外国专利> Sample analysis apparatus, sample analysis system, abnormality detection apparatus, and abnormality detection method of sample analysis apparatus

Sample analysis apparatus, sample analysis system, abnormality detection apparatus, and abnormality detection method of sample analysis apparatus

机译:样本分析装置,样本分析系统,异常检测装置以及样本分析装置的异常检测方法

摘要

The present invention provides a sample analysis device, an analysis system, an anomaly detection device and an anomaly detection method which can carry out the quality control without needing a quality control sample and a normal sample. The sample analysis device selects the measurement results of the detected persons having a certain diseases from the measurement results obtained from the sample analysis device, and the measurement results deviating from a certain burst value exclusion range are excluded out of the measurement results used for the anomaly detection, and only the measurement results in the burst value exclusion range are used as the measurement results for the anomaly detection. When the number of the measurement results used for the anomaly detection reaches a certain value, the sample analysis device calculates the average value of the measurement values of the measured items having smaller change than health, and compares the average value with a certain management range to thereby carry out the anomaly detection.
机译:本发明提供了一种不需要质量控制样品和普通样品就可以进行质量控制的样品分析装置,分析系统,异常检测装置和异常检测方法。样本分析装置从从样本分析装置获得的测量结果中选择具有某种疾病的被检测者的测量结果,并且将偏离某一突发值排除范围的测量结果排除在用于异常的测量结果之外。检测时,仅将突发值排除范围内的测量结果用作异常检测的测量结果。当用于异常检测的测量结果的数量达到一定值时,样本分析装置计算变化小于健康的被测项目的测量值的平均值,并将该平均值与某个管理范围进行比较。从而进行异常检测。

著录项

  • 公开/公告号JP6150635B2

    专利类型

  • 公开/公告日2017-06-21

    原文格式PDF

  • 申请/专利权人 シスメックス株式会社;

    申请/专利号JP20130136624

  • 发明设计人 赤松 慎治郎;八尾 俊佑;

    申请日2013-06-28

  • 分类号G01N35/00;

  • 国家 JP

  • 入库时间 2022-08-21 13:55:38

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