首页>
外国专利>
Method of predicting creep remaining life of product degraded by heating and pressurization and calibration curve creating method used for this prediction method
Method of predicting creep remaining life of product degraded by heating and pressurization and calibration curve creating method used for this prediction method
展开▼
机译:预测因加热和加压而降解的产品的蠕变剩余寿命的方法以及用于该预测方法的校准曲线创建方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
To provide a method of predicting the remaining creep life of a product deteriorated by heating and pressurization. Namely, a step of setting an arbitrary evaluation range on the surface of the product, a step of obtaining the number and the length of the grain boundaries where the void exists within the evaluation range, a step of obtaining a grain boundary on each of the grain boundaries Determining the number of voids present and the length of the grain boundary direction, the number and length of the grain boundaries in which the voids obtained are present and the number of voids present on each of the obtained grain boundaries and A step of obtaining an M parameter based on a length in the grain boundary direction based on the following equation, and a step of obtaining a damage rate of the product from the obtained M parameter, wherein the product has a bainite structure. Estimate creep remaining life expectancy method.(1) (Wherein, M represents the number of grain boundaries where the void exists, N represents the number of voids present on each grain boundary, LiRepresents the length of the i-th void existing on the -th grain boundary in the grain boundary direction, LRepresents the length of the -th grain boundary where the void exists. )
展开▼
机译:提供一种预测由于加热和加压而劣化的产品的剩余蠕变寿命的方法。即,在产品的表面上设定任意的评价范围的步骤,求出在该评价范围内存在空隙的晶界的数量和长度的步骤,在每个晶界上求出晶界的步骤。确定存在的空隙的数量和晶界方向的长度,存在获得的空隙的晶粒边界的数量和长度,以及在每个获得的晶粒边界上存在的空隙的数量以及获得步骤根据以下等式,基于在晶界方向上的长度的M参数,以及从所获得的M参数获得产品的损伤率的步骤,其中所述产品具有贝氏体结构。估计蠕变剩余寿命预期方法。(1)(其中,M表示存在空隙的晶界数量,N表示每个晶界上存在的空隙数量,L i Sub>表示长度存在于第i个晶界上的第i个晶界沿晶界方向,L表示存在该空隙的第i个晶界的长度。)
展开▼