首页> 外国专利> Its application method and system in a data sampling method and system, and parameter identification

Its application method and system in a data sampling method and system, and parameter identification

机译:其在数据采样方法和系统中的应用方法和系统以及参数识别

摘要

The present invention relates to a data sampling method: sampling a physical quantity according to a sampling frequency f s ‰¤ f sh , f sn = ¶ max / µ being the upper limit of the sampling frequency; and a data sampling method and system: sampling a physical quantity with a sampling frequency satisfying Nyquist theorem, firstly performing digital low-pass filtering on an obtained sampled sequence, and then re-sampling, the re-sampling frequency f s ‰¤ ¶ max / µ , where µ is the Z-domain error of a sampling system, and ¶ max is the maximum error of an S-domain. The present invention also relates to a parameter identification method and system which firstly adopt the above data sampling method and system to obtain sampled data, and then utilize the sampled data to perform dynamic and/or static parameter identification. The data sampling method and system and the parameter identification method and system of the present invention solve technical difficulties such as relatively large errors in sampled data, digital control instability, and parameter identification failure.
机译:本发明涉及一种数据采样方法:根据采样频率f s≠f sh,对物理量进行采样,其中,f sn =¶max / µ为采样频率的上限;以及一种数据采样方法和系统:以满足奈奎斯特定理的采样频率对物理量进行采样,首先对获得的采样序列进行数字低通滤波,然后进行重新采样,所述重新采样频率为fs‰max / µ,其中µ是采样系统的Z域误差,¶max是S域的最大误差。本发明还涉及一种参数识别方法和系统,其首先采用上述数据采样方法和系统获取采样数据,然后利用采样数据进行动态和/或静态参数识别。本发明的数据采样方法和系统以及参数识别方法和系统解决了诸如采样数据中的较大误差,数字控制不稳定性和参数识别故障之类的技术难题。

著录项

  • 公开/公告号JP6069809B2

    专利类型

  • 公开/公告日2017-02-01

    原文格式PDF

  • 申请/专利权人 ▲ハォ▼玉山;

    申请/专利号JP20150537134

  • 发明设计人 ▲ハォ▼玉山;

    申请日2013-10-23

  • 分类号H03M1/54;

  • 国家 JP

  • 入库时间 2022-08-21 13:55:02

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号