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Lithographic resist underlayer film forming composition comprising a polymer containing an acrylamide structure and an acrylate structure

机译:光刻胶下层膜形成组合物,其包含含有丙烯酰胺结构和丙烯酸酯结构的聚合物

摘要

PROBLEM TO BE SOLVED: To provide a resist underlayer film forming composition for forming a resist underlayer film that can be dry-etched at the time of pattern transfer from an upper layer or processing a substrate and can be removed with an alkaline aqueous solution after the substrate processing. A polymer (A) containing a unit structure represented by the following formula (1) and a unit structure represented by the following formula (2), a blocked isocyanate group, a methylol group, or alkoxymethyl having 1 to 5 carbon atoms. A resist underlayer film forming composition comprising a crosslinkable compound (B) having at least two groups selected from a group and a solvent (C), wherein the polymer (A) is a unit represented by the formula (1) The unit structure represented by the formula (1) and the unit structure represented by the formula (1): the unit structure represented by the formula (2): the unit structure represented by the formula (2) = 25 to 60:75 to 40 The composition is a polymerized polymer. [Chemical 1] [Selected figure] None
机译:解决的问题:提供一种用于形成抗蚀剂下层膜的抗蚀剂下层膜形成用组合物,该组合物可以在从上层进行图案转印时进行干法蚀刻或对基板进行加工,并且可以在使用后用碱性水溶液除去。基板处理。聚合物(A),其具有下述式(1)表示的单元结构和下述式(2)表示的单元结构,具有1〜5个碳原子的封端异氰酸酯基,羟甲基或烷氧基甲基。抗蚀剂下层膜形成用组合物,其包含具有选自基团中的至少两个以上的基团的交联性化合物(B)和溶剂(C),其中,聚合物(A)为由式(1)表示的单元。式(1)和式(1)表示的单元结构:式(2)表示的单元结构:式(2)表示的单元结构= 25〜60:75〜40。聚合的聚合物。 [化学1] [所选图形]无

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