Laboratory x-ray microtomography system having a crystallographic grain orientation mapping function

摘要

3-D method and system for the crystallographic grain orientation mapping, a polycrystalline sample is illuminated with broad band X-ray beam obtained from the laboratory X-ray source, the one or more X-ray detectors in, detects the beams diffracted from the sample, by processing the data obtained from the diffracted beam in the sample is different rotational positions, the crystal grain orientation, position, and / or in three dimensions a three-dimensional volume reconfigure. Certain cone-beam geometry, take advantage of the fact that when distributed beam of X-ray point source is focused on the diffraction plane direction X-rays reflected from stretching grain.