首页> 外国专利> PARTICLE COMPONENT ANALYZING DEVICE, PARTICLE MULTIPLE-ANALYZING DEVICE AND METHOD FOR USING THE PARTICLE COMPONENT ANALYZING DEVICE

PARTICLE COMPONENT ANALYZING DEVICE, PARTICLE MULTIPLE-ANALYZING DEVICE AND METHOD FOR USING THE PARTICLE COMPONENT ANALYZING DEVICE

机译:微粒成分分析装置,微粒多重分析装置以及使用微粒成分分析装置的方法

摘要

A particle component analyzing device is provided. The particle component analyzing device comprises: a catching body which catches a particle in an aerosol which is subject to measurement, an energy beam irradiating unit which irradiates an energy beam to the particle which is caught by the catching body, and an analyzer which analyzes at least any of a component and an amount of the particle based on a desorbed component of the particle which is desorbed from the catching body by irradiation of the energy beam, wherein the catching body has a temperature measuring unit, the particle component analyzing device further comprising a controlling unit which controls an output of the energy beam irradiating unit based on a temperature of the catching body which is measured by the temperature measuring unit.
机译:提供一种颗粒成分分析装置。粒子成分分析装置包括:将被捕获的气溶胶中的粒子捕获的捕获体;将能量束照射到被捕获体捕获的粒子上的能束照射单元;以及在以下位置进行分析的分析器:基于通过能量束的照射而从捕获体上解吸的颗粒的解吸组分中的至少一种成分和量的颗粒,其中,所述捕获体具有温度测量单元,所述颗粒成分分析装置还包括控制单元基于由温度测量单元测量的捕获体的温度来控制能量束照射单元的输出。

著录项

获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号