首页> 外国专利> IDENTIFYING SOURCES OF ANOMALIES IN MULTI-VARIABLE METRICS USING LINEARIZATION

IDENTIFYING SOURCES OF ANOMALIES IN MULTI-VARIABLE METRICS USING LINEARIZATION

机译:使用线性化识别多变量度量中的异常源

摘要

The present disclosure is directed toward systems and methods for identifying contributing factors associated with a multi-variable metric anomaly. One or more embodiments described herein identify one or more contributing factors that led to an anomaly in a multi-variable metric by calculating linearizing weights such that the total deviation in the multi-variable metric can be written as a weighted sum of deviations for dimension elements associated with the multi-variable metric.
机译:本公开针对用于识别与多变量度量异常相关的贡献因素的系统和方法。本文所述的一个或多个实施例通过计算线性权重来识别导致多变量量度异常的一个或多个贡献因素,从而可以将多变量量度中的总偏差写为尺寸元素偏差的加权和。与多变量指标相关联。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号