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Systems and methods for improving image quality in cone beam computed tomography

机译:在锥束计算机断层摄影中改善图像质量的系统和方法

摘要

The present invention focuses on an analytical model for fast and accurate scatter estimation. The present invention uses the Klein-Nishina (KN) formula as a starting point, which gives the Compton scattering differential cross-section for an interaction point. For a direct integration of the point scatter kernel over the irradiated volume, the large number of KN formulae (e.g., amount of solid angle subtended) and rays traced required for calculating attenuation makes the computation very expensive. The present invention reduces the 3D formulation into an efficient 2D approach by integrating the KN formula along an interaction line of tissue-equivalent medium. An average attenuation length was assumed for each interaction point on the beam to reduce the number of rays traced. In the case of kilovoltage (kV) x rays as the imaging source and a small imaging field, with in-field scatter, the line integral derived, can be approximated by a compact analytical form.
机译:本发明集中于用于快速和准确的散射估计的分析模型。本发明使用Klein-Nishina(KN)公式作为起点,其给出了相互作用点的康普顿散射微分截面。对于在散射体积上的点散射核的直接积分,计算衰减所需的大量KN公式(例如,所包围的立体角的数量)和所跟踪的射线使计算非常昂贵。本发明通过沿着组织等效介质的相互作用线整合KN公式,将3D公式简化为有效的2D方法。假定光束上每个相互作用点的平均衰减长度可以减少所追踪的光线数量。如果以千伏(kV)x射线为成像源,并且成像场较小,且具有场内散射,则可以通过紧凑的分析形式来近似得出线积分。

著录项

  • 公开/公告号US9615807B2

    专利类型

  • 公开/公告日2017-04-11

    原文格式PDF

  • 申请/专利权人 JOHN DANIEL BOURLAND;JIE LIU;

    申请/专利号US201414262657

  • 发明设计人 JIE LIU;JOHN DANIEL BOURLAND;

    申请日2014-04-25

  • 分类号A61B6/03;A61B6/00;G01N23/04;G06T11/00;

  • 国家 US

  • 入库时间 2022-08-21 13:47:34

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