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Methods for fabricating semiconductor or micromachined devices with metal structures and methods for forming self-aligned deep cavity metal structures

机译:具有金属结构的半导体或微机械器件的制造方法以及形成自对准深腔金属结构的方法

摘要

Methods for fabricating semiconductor or micromachined devices with metal structures and methods for forming self-aligned deep cavity metal structures are provided. A method for fabricating a device with a metal structure includes patterning a mask with an opening perimeter bounding an opening over a substrate. The method includes performing an isotropic etch to etch a shallow portion of the substrate exposed by the opening and a shallow portion of the substrate underlying the opening perimeter of the mask. The method also includes performing an anisotropic etch to etch a deep portion of the substrate exposed by the mask opening and a deep portion of the substrate underlying the opening perimeter of the mask to form a cavity having a bottom surface. Further, the method includes depositing metal over the mask, into the mask opening and onto the bottom surface, wherein the metal on the bottom surface forms the metal structure.
机译:提供了用于制造具有金属结构的半导体或微机械器件的方法以及用于形成自对准深腔金属结构的方法。一种用于制造具有金属结构的器件的方法,该方法包括:对具有限定衬底上方的开口的开口周界的掩模进行构图。该方法包括执行各向同性蚀刻以蚀刻由开口暴露的衬底的浅部分和在掩模的开口周边下方的衬底的浅部分。该方法还包括执行各向异性蚀刻以蚀刻由掩模开口暴露的衬底的较深部分和掩模的开口周边下方的衬底的较深部分,以形成具有底表面的腔。此外,该方法包括在掩模上方,掩模开口中和底表面上沉积金属,其中底表面上的金属形成金属结构。

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