首页> 外国专利> APPARATUS FOR MEASURING MICRO-CRACKS IN A MEMBRANE ELECTRODE ASSEMBLY AND METHOD FOR PREDICTING GENERATION OF MICRO-CRACKS IN THE SAME

APPARATUS FOR MEASURING MICRO-CRACKS IN A MEMBRANE ELECTRODE ASSEMBLY AND METHOD FOR PREDICTING GENERATION OF MICRO-CRACKS IN THE SAME

机译:用于测量膜电极组件中的微裂纹的装置以及用于预测同一微裂纹产生的方法

摘要

An apparatus for measuring micro-cracks in a membrane electrode assembly includes a resistance measurement unit to measure variation in electrical resistance of the membrane electrode assembly while tensioning the membrane electrode assembly in a state in which power is applied to an upper catalyst layer while a lower catalyst layer is insulated, an image capture unit to capture an image of micro-cracks in the upper catalyst layer while the membrane electrode assembly is being tensioned, and a controller to detect, in real time, variation in electrical resistance measured by the resistance measurement unit, corresponding to the image of micro-cracks captured by the image capture unit, and to interpret the size of the micro-cracks generated in the membrane electrode assembly based on the detected variation in electrical resistance.
机译:用于测量膜电极组件中的微裂纹的设备包括电阻测量单元,该电阻测量单元在向上催化剂层施加功率而下层催化剂施加功率的状态下张紧膜电极组件的同时测量膜电极组件的电阻变化。催化剂层是绝缘的,图像捕获单元用于在张紧膜电极组件时捕获上层催化剂层中微裂纹的图像,以及控制器,用于实时检测通过电阻测量测得的电阻变化单元,其对应于由图像捕获单元捕获的微裂纹的图像,并基于检测到的电阻变化来解释在膜电极组件中产生的微裂纹的尺寸。

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