首页> 外国专利> Wavefront-division polarimetric analysis method and device, spectropolarimeter, polarimetric camera and optical microscope using such a device

Wavefront-division polarimetric analysis method and device, spectropolarimeter, polarimetric camera and optical microscope using such a device

机译:波前分频偏振分析方法和装置,分光偏振计,偏振照相机和使用该装置的光学显微镜

摘要

An accurate and robust wavefront-division polarimetric analysis method and device, allows the quasi-instantaneous measurement of the polarization states of a luminous object. The device can be used to produce a plurality of light beams, all polarized according to different polarization states, from a single upstream light beam. The polarized light beams, which do not overlap and which carry information items that are complementary in terms of polarization, are analyzed simultaneously by a plurality of detectors that measure the luminous intensity of each beam. Processing elements digitally process the luminous intensity values obtained in order to determine the polarization state of the upstream light beam. The operations performed by the processing elements prevent luminous intensity variations in the split light beams during the division of the wavefront of the upstream light beam. Therefore, the wavefront-division polarimetric analysis device is robust and its accuracy is not hindered by the experimental conditions.
机译:准确而鲁棒的波前分割极化分析方法和设备,可以准瞬时测量发光物体的极化状态。该装置可以用于从单个上游光束产生全部根据不同偏振态偏振的多个光束。通过测量每个光束的发光强度的多个检测器,同时分析不重叠并且携带在偏振方面互补的信息项的偏振光束。处理元件对获得的发光强度值进行数字处理,以确定上游光束的偏振状态。在上游光束的波前分割期间,由处理元件执行的操作防止了分离光束中的发光强度变化。因此,波前分频偏振分析设备坚固耐用,其精度不受实验条件的影响。

著录项

  • 公开/公告号US9551618B2

    专利类型

  • 公开/公告日2017-01-24

    原文格式PDF

  • 申请/专利权人 HORIBA JOBIN YVON SAS;

    申请/专利号US201314417618

  • 申请日2013-07-25

  • 分类号G01J4/00;G01J4/02;G01J4/04;

  • 国家 US

  • 入库时间 2022-08-21 13:42:53

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